Helmholtz International Research School for Teratronics

Technical Modules

The Helmholtz International Research School for Teratronics conveys key competences in regard to technological knowhow within the field of Teratronics as well as in management qualification. On the following pages you find information on the dates.
Technical Modules




Prof. Müller, Dr. Bründermann



  • Basic operation principles of modern accelerators and synchrotrons
  • simulation tools
  • comparison to other sources and detection methods



 July / September 2018

Quantum information processing

Prof. Ustinov

  • Introduction to quantum theory, quantum technology, quantum gates
  • Implementation platforms: atoms, ions, spins, circuits
  • Superconducting quantum circuits


 tba 2018


Basics of analog and digital electronics

Prof. Weber

  • Tour de force through analog and digital electronics for beginners

tba 2018

to register please send an E-Mail to antje.martin∂kit.edu

Microwave Engineering and Measurement Techniques

Prof. Zwick

  • Basics of microwave engineering and methodology

  • Standard microwave measurement methods




 tba 2018

Integrated Photonics

Prof. Koos

  • Introduction into theory, technology and applications of photonic integrated circuits (PIC).



 tba 2018


Digital Signal Processing

Prof. Becker

  • Fundamentals and classification schemes in computing architectures
  • System on Chip design and IP based technologies
  • HW-/SW-Partitioning Technologies


 tba 2018

Digital Design and Test Automation Flow

Prof. Tahoori

  • Spezifikation, Simulation und Synthese auf System-Ebene
  • Simulation und Synthese auf Logik-Ebene
  • Design for Testability
  • Generierung von Testmustern und Fehlersimulation
  • Physisches Design und Verifikation
  • Timing, Flächen und Verbrauchsanalysen.




July 30 - August 3, 2018

to register, send Email to


Micro and Nano Characterisation
  • Introduction to Transmission Electron Microscopy and its use in materials sciences
  • Basic understanding of TEM operation, image formation and analytical TEM
    techniques to understand its use for materials characterization.

tba 2018

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